Test Challenges for Deep Sub-Micron Technologies
K-T.Cheng, S.Dey, M.Rodgers, K.Roy, "Test Challenges for Deep Sub-Micron Technologies", in Proc. Design Automation Conf., Los Angeles, June 2000.
K-T.Cheng, S.Dey, M.Rodgers, K.Roy, "Test Challenges for Deep Sub-Micron Technologies", in Proc. Design Automation Conf., Los Angeles, June 2000.