YI ZHAO



Department of Electrical and Computer Engineering
University of California, San Diego

Advisor: Prof. Sujit Dey

Office: 2520 Engineering Building Unit I
Email: yizhao@ece.ucsd.edu
Lab Phone: (858)534-7883 (858)822-3751
Fax: (858)822-3427
Cell Phone: (858)832-3233
Home Phone: (858)484-0589

RESEARCH INTEREST

VLSI testing and fault-tolerance design
ECAD development for testing, power optimization and signal integrity
Design technologies for analog-mixed System-on-Chip developement with DSM technology

EDUCATIONMAJORSCHOOLGRADUATION
Ph.D
 Electrical and Computer Engineering/Computer Engineering UC San Diego
Fall 2003
M.S.
 Electrical Engineering/Applied Physics Chinese Academy of Sciences
June 1995
B.S.
 Electrical Engineering/Optoelectronics Univ. of Elect. Sci. & Tech. of China
June 1992

MAJOR CONTRIBUTIONS

1. Design & Fabrication of 1st 2.1 um Antimonide-based multi-quantum-well laser diode (MQW-LD) in China/2nd in this field
2. Creation of digital and mixed-signal reference design & verification flows for IBM-West Foundry Service group
3. Development of Robustuner---1st configurable robustness optimization EDA tool prototype for ASIC
4. Active publication of research papers in diverse fields of sicences & technologies

Ph.D DISSERTATION
Thesis Title: Modeling and Testing for on-chip Defect-Sensitive Noises for Deep-submicron Circuits and Chip Systems
Thesis Advisor: Prof. Sujit Dey

As semiconductor technology enters deep-submciron (DSM) domain, on-chip noises increasingly pose serious threats to the reliability of complex System-on-Chips. These emerging challenges necessitate, and this thesis introduces, new approaches to test such DSM noises, which are sensitive to aggressive design and DSM manufacturing defects in nature. On testing route, this work focuses on testing DSM defect-sensitive noises, and provided a wide spectrum of cost- effective solutions to facilitate such tests beyond manufacturing exit. Our contributions include defect analysis and fault modeling, and designing of on-line testing/diagnosis/repairing circuitry for non-deterministic testing, as well as development of a vertical software platform for deterministic testing(ATPG) of such DSM noises.

JOURNAL PUBLICATIONS

· Y. Zhao, C. Zhao, and S. Dey, Adaptive Robustness Insertion for Soft Errors in Nanometer Circuits, Journal of Electronic Testing: Theory and Applications (in submission).

· Y. Zhao, L. Chen, and S. Dey, Double-Sampling Data Checking Technique, An Cost-Effective Approach for Compound Noise Effects on Chip Interconnects, IEEE Trans. on VLSI Circuits and Systems (accepted: pdf manuscript available).

· Y. Zhao, L. Chen, and S. Dey, On-line Testing of Multi-source Noise-induced Errors on the Interconnects and Buses of System-on-Chips, Global Semiconductor, June, pp. 94-97, 2003. (pdf doc)

· Y. Zhao and S. Dey, Fault Coverage Analysis Techniques of Crosstalk on Chip Interconnects, IEEE Transaction on Computer Aided Design, June, pp. 770-782, 2003. (pdf doc)

· C. Taylor, S. Dey and Y. Zhao, Power Modeling and Optimization of Deep-submicron Interconnects in Nanometer Circuit, IEEE Trans. on VLSI Circuits and Systems (in submission).

· S. Dey, M. Cuviello, X. Bai, Y. Zhao, Fault Modeling and Simulation for Crosstalk in System-on-Chip Interconnects IEEE Trans. on Computer-Aided Design (in submission).

· Y. Zhao, C. W. Tu, I.-T. Bae, and T. -Y. Seong, Growth of Cubic GaN by Phosphorus-Mediated Molecular Beam Epitaxy, Applied Physics Letters, Vol. 74 (21), pp.3182-3184, 1999.(pdf doc)

· Y. Zhao, F. Deng, S. S. Lau, and C. W. Tu, Effect of Arsenic in Gas-Source Molecular Beam Epitaxy, Journal of Vacuum Science and Technology, Vol. B 16(3), pp. 1297-1299, 1997.(pdf doc)

· A. Z. Li, Y. Zhao, Y. L. Zheng, G. T. Chen, G. P. Ru, W. Z. Shen and J. Q Zhong, MBE Growth and Characterization of High-Quality GaInAsSb/AlGaAsSb Strained Multiple Quantum-Well Structures, Journal of Crystal Growth, Vol. 175/176, pp. 873-876, 1997.(pdf doc)

· W. Z. Shen, S. C. Shen, and W. G. Tang, Y. Zhao and A. Z. Li, Optical Investigation of Quaternary GaInAsSb/ AlGaAsSb Strained Quantum Wells, Applied Physics Letter, Vol. 67(23), pp. 432-3424, 1995.(pdf doc)

 

CONFERENCES

· Y. Zhao and S. Dey, Separate-Dual-Transistor (SDT) Register-An on-line Testing Solution for Soft Errors in UDMS-IC, Proc. of 2003 Intl. On-Line Testing Symposium, Kos Island, Greece, 2003.

· Y. Zhao, L. Chen, and S. Dey, On-Line Testing of Multi-source DSM noise of Interconnects and Buses in SoC, Proc. of Intl. Testing Conf. 2002, Baltimore, USA, 2002.

· Y. Zhao and S. Dey, Testing of Compound Noise Effects on Global Interconnects and Buses, Intl. Test & Synth. Workshop 2002, Santa Barbara, April, 2002

· C. N. Taylor, S. Dey, Y. Zhao, Modeling and Minimization of Interconnect Energy Dissipation in Nanometer Technology, Proc. 38th Design Automation Conference (DAC), June 2001.

· Y. Zhao and S. Dey, Analysis of Interconnect Crosstalk Defects by Arbitrary Test Set, Proc. of Intl. Test Conf. 2000, Atlanta City, USA, 2000.

· Y. Zhao and S. Dey, Analysis of Interconnect Crosstalk Defect Coverage of Test Set, SRC TechCon 2000, Phoenix, USA, 2000.

· C. N. Taylor, S. Dey, Y. Zhao, Power Modeling and Optimization Techniques of DSM Interconnects, SRC TechCon 2000, Phoenix, USA, 2000.

· M. Cuveillo, X. Bai, S. Dey, and Y. Zhao, Fault Modeling and Simulation for Crosstalk in System-on-Chip Interconnects, Proc. of Intl. Conf. on Computer-aided Design, San Jose, USA, 1999.

· Y. Zhao, C. W. Tu, I.-T. Bae, and T.-Y. Seong, Growth of Cubic GaN by Phosphorus-Mediated MBE growth, 40th TMS/IEEE Electronic Materials Conference, Charlottesville, USA, 1998.

· Y. Zhao, F. Deng, S.S. Lau and W.C Tu, Arsenic Surfactant Effects in Gas-Source MBE, 16th North America Conf. on Molecular Beam Epitaxy, Ann Arbor, USA, 1997.


Currently I am ACTIVELY seeking R&D positions in the field of design automation and testing of VLSI circuits and systems.
My resume is available in PDF format (updated on July 20, 2003).

Campus mailing address:

Yi Zhao
University of California, San Diego
ECE - EBU-I/2704
9500 Gilman Drive
La Jolla, CA 92093-0407