Separate Dual Transistor Registor-an Circuit Solution for on-line Testing of Transient Errors in UDSM-IC,
Y.Zhao, S.Dey, "Separate Dual Transistor Registor-an Circuit Solution for on-line Testing of Transient Errors in UDSM-IC," in Proc. Intl. On-line Testing Symposium 2003, pp.7-11, Kos Island, Greece, June 2003.